Materials characterizations

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Materials characterizations

All epiwafers and materials produced by NOVAGAN are inspected using state-of-the-art analytical and characterization tools to ensure that our customers’ requirements are always reached. A certificate that insures that the epitaxial layers and structures comply with customers specifications is included with product shipments.

In house characterization techniques include:
• Atomic force microscopy (AFM)
• Scanning electron microscopy (SEM)
• Transmission electron microscopy (TEM)
• Photoluminescence (PL) & Micro-Photoluminescence (?-PL)
• Electroluminescence (EL)
• Ultra violet/visible transmission & reflectivity
• Cathodoluminescence (CL)
• Hall effect
• Capacitance-Voltage (CV)
• High resolution x-ray diffraction (HR-XRD)

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